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Basic Optics Beam Splitter used for Brewster’s Angle Experiments.
Includes +200, +100 mm lenses. Each lens is mounted in a lens holder for protection and easy storage.
An all-in-one bright point source, illuminated crossed-arrow object, primary-color source, and ray box with up to five parallel rays.
A rotating disk with a polar grid that provides an excellent surface for measuring incident, reflected, and or refracted light rays.
Project images onto this white plastic screen, which is used with Basic Optics systems.
Measure the intensity of reflected light and determine Brewster’s Angle. An accessory for the Educational Spectrophotometer System.
A double-sided mirror, concave on one side and convex on the other, and a semicircular half-screen. Both are mounted in a holder for easy placement on the Basic Optics Track.
Attaches optical components directly to a Dynamic Tracks via carriages that can be positioned anywhere on the track.
A complete set of equipment for exploring light, color, and optical technology. Includes an optics bench, light source, viewing screen lenses, mirrors, diffraction grating, and more.
This Bracket allows the Human Eye Model to be used with the Basic Optics System.
Set of three 50 mm diameter lenses.
Holds the receiver/amplifier and other objects for the Microwave Optics systems (WA-9314B, WA-9316).
This Receiver with built-in Amplifier is used in the Microwave Optics systems (WA-9314C, WA-9316A).
This Transmitter is used in the Microwave Optics systems (WA-9314B, WA9316).
A light weight caliper designed to allow measurements in the dark during optical experiments.
Teaches students basic optical principles and allows quantitative measurements that rival those of more expensive units. This is the PASPORT version.
Adds a central platform and diffuser to polarizer demonstrator, show wavelength dependence of optical rotation.
Replacement polarizer disks for the Beginning Optics System (OS-8459).
Includes two slit wheels allowing students to examine various diffraction patterns.
Enables students to scan many diffraction and interference patterns during one lab period.
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